IP Library Granted Patent US 6,614,031
Granted Patent Utility
US 6,614,031 · App. 09/946,695

Method for examining a specimen, and confocal scanning microscope

Inventors: Johann Engelhardt, Juergen Hoffmann, Werner Knebel
Patented Case View Patent ↗
Granted: Sep 2, 2003 Filed: Sep 4, 2001
Inventors
Johann Engelhardt
Juergen Hoffmann
Werner Knebel
Assignee (at issue)
Leica Microsystems Heidelberg GmbH

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Quick Facts
Patent No.
US 6,614,031
App. No.
09/946,695
Filed
2001-09-04
Granted
2003-09-02
Kind
B2