IP Library Granted Patent US 6,617,841
Granted Patent Utility
US 6,617,841 · App. 09/741,123

Method and apparatus for characterization of electronic circuitry

Inventor: Hemavann Thao
Patented Case View Patent ↗
Granted: Sep 9, 2003 Filed: Dec 19, 2000
Inventor
Hemavann Thao
Assignee (at issue)
Sun Microsystems Inc.

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Quick Facts
Patent No.
US 6,617,841
App. No.
09/741,123
Filed
2000-12-19
Granted
2003-09-09
Kind
B2