Granted Patent
Utility
US 6,624,653 · App. 10/037,562
Method and system for wafer level testing and burning-in semiconductor components
Inventor:
Daniel P. Cram
Patented Case
View Patent ↗
Granted: Sep 23, 2003
Filed: Jan 7, 2002
Inventor
Daniel P. Cram
Assignee (at issue)
Micron Technology, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.