IP Library Granted Patent US 6,632,015
Granted Patent Utility
US 6,632,015 · App. 09/837,835

Thermal analysis apparatus

Inventor: Jun Nagasawa
Patented Case View Patent ↗
Granted: Oct 14, 2003 Filed: Apr 18, 2001
Inventor
Jun Nagasawa
Assignee (at issue)
SEIKO INSTRUMENTS INC.

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Quick Facts
Patent No.
US 6,632,015
App. No.
09/837,835
Filed
2001-04-18
Granted
2003-10-14
Kind
B2