Granted Patent
Utility
US 6,646,263 · App. 10/123,666
Method of X-ray analysis in a particle-optical apparatus
Inventors:
Laurens Franz Taemsz Kwakman, Kars Z. Troost
Patented Case
View Patent ↗
Granted: Nov 11, 2003
Filed: Apr 16, 2002
Inventors
Laurens Franz Taemsz Kwakman
Kars Z. Troost
Assignee (at issue)
FEI Company
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.