IP Library Granted Patent US 6,649,919
Granted Patent Utility
US 6,649,919 · App. 09/960,224

Real time monitoring simultaneous imaging and exposure in charged particle beam systems

Inventors: Peter Chao, Steve Rosenberg
Patented Case View Patent ↗
Granted: Nov 18, 2003 Filed: Sep 20, 2001
Inventors
Peter Chao
Steve Rosenberg
Assignee (at issue)
FEI Company

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Quick Facts
Patent No.
US 6,649,919
App. No.
09/960,224
Filed
2001-09-20
Granted
2003-11-18
Kind
B2