IP Library Granted Patent US 6,653,052
Granted Patent Utility
US 6,653,052 · App. 09/810,194

Electron device manufacturing method, a pattern forming method, and a photomask used for those methods

Inventors: Toshihiko Tanaka, Norio Hasegawa, Hiroshi Shiraishi, Hidetoshi Satoh
Patented Case View Patent ↗
Granted: Nov 25, 2003 Filed: Mar 19, 2001
Inventors
Toshihiko Tanaka
Norio Hasegawa
Hiroshi Shiraishi
Hidetoshi Satoh
Assignee (at issue)
HITACHI, LTD.

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Quick Facts
Patent No.
US 6,653,052
App. No.
09/810,194
Filed
2001-03-19
Granted
2003-11-25
Kind
B2