IP Library Granted Patent US 6,654,938
Granted Patent Utility
US 6,654,938 · App. 09/949,088

Delay characteristic analyzing method and delay characteristic analyzing system for a custom LSI

Inventor: Kazuyuki Kosugi
Patented Case View Patent ↗
Granted: Nov 25, 2003 Filed: Sep 10, 2001
Inventor
Kazuyuki Kosugi
Assignee (at issue)
Fujitsu Limited

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Quick Facts
Patent No.
US 6,654,938
App. No.
09/949,088
Filed
2001-09-10
Granted
2003-11-25
Kind
B2