Granted Patent
Utility
US 6,657,461 · App. 09/815,146
System and method for high speed integrated circuit device testing utilizing a lower speed test environment
Inventors:
Oscar Frederick Jones, Jr., Michael C. Parris
Patented Case
View Patent ↗
Granted: Dec 2, 2003
Filed: Mar 22, 2001
Inventors
Oscar Frederick Jones, Jr.
Michael C. Parris
Assignee (at issue)
MOSEL VITELIC INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.