Granted Patent
Utility
US 6,671,847 · App. 09/709,000
I/O device testing method and apparatus
Inventors:
Chi-Yeu Chao, Tawfik Arabi, Thomas D. Barrett, Gregory F. Taylor
Patented Case
View Patent ↗
Granted: Dec 30, 2003
Filed: Nov 8, 2000
Inventors
Chi-Yeu Chao
Tawfik Arabi
Thomas D. Barrett
Gregory F. Taylor
Assignee (at issue)
Intel Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.