Granted Patent
Utility
US 6,690,189 · App. 09/927,404
Apparatus and method for testing semiconductor integrated circuit
Inventors:
Hisaya Mori, Shinji Yamada, Teruhiko Funakura
Patented Case
View Patent ↗
Granted: Feb 10, 2004
Filed: Aug 13, 2001
Inventors
Hisaya Mori
Shinji Yamada
Teruhiko Funakura
Assignees (at issue)
Renesas Technology Corporation
Ryoden Semiconductor System Engineering Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.