Granted Patent
Utility
US 6,694,492 · App. 09/540,456
Method and apparatus for optimizing production yield and operational performance of integrated circuits
Inventor:
Rajesh G. Shakkarwar
Patented Case
View Patent ↗
Granted: Feb 17, 2004
Filed: Mar 31, 2000
Inventor
Rajesh G. Shakkarwar
Assignee (at issue)
ATI International SRL
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.