Granted Patent
Utility
US 6,696,845 · App. 10/205,726
Noise evaluation circuit for IC tester
Inventor:
Masayuki Kamata
Patented Case
View Patent ↗
Granted: Feb 24, 2004
Filed: Jul 25, 2002
Inventor
Masayuki Kamata
Assignee (at issue)
Ando Electric Co., Ltd. (Japanese)
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.