Granted Patent
Utility
US 6,700,581 · App. 10/087,654
In-circuit test using scan chains
Inventors:
David R. Baldwin, Nicholas J. N. Murphy, Andrew Peter Maund, Paul Simon Pontin, Steve Cooper
Patented Case
View Patent ↗
Granted: Mar 2, 2004
Filed: Mar 1, 2002
Inventors
David R. Baldwin
Nicholas J. N. Murphy
Andrew Peter Maund
Paul Simon Pontin
Steve Cooper
Assignee (at issue)
3D Labs Co., Ltd.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.