Granted Patent
Utility
US 6,701,270 · App. 09/957,410
Method for reliability testing leakage characteristics in an electronic circuit and a testing device for accomplishing the source
Inventors:
Leah M. Miller, Anand Govind
Patented Case
View Patent ↗
Granted: Mar 2, 2004
Filed: Sep 20, 2001
Inventors
Leah M. Miller
Anand Govind
Assignee (at issue)
LSI Logic Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.