Granted Patent
Utility
US 6,701,477 · App. 09/591,603
Method for identifying the cause of yield loss in integrated circuit manufacture
Inventor:
Julie Segal
Patented Case
View Patent ↗
Granted: Mar 2, 2004
Filed: Jun 9, 2000
Inventor
Julie Segal
Assignee (at issue)
Hueristics Physics Laboratories
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.