IP Library › Granted Patent US 6,704,231
Granted Patent Utility
US 6,704,231 · App. 10/397,211

Semiconductor memory device with circuit executing burn-in testing

Inventors: Fukashi Morishita, Mitsuya Kinoshita
Patented Case View Patent ↗
Granted: Mar 9, 2004 Filed: Mar 27, 2003
Inventors
Fukashi Morishita
Mitsuya Kinoshita
Assignee (at issue)
Renesas Technology Corporation

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Quick Facts
Patent No.
US 6,704,231
App. No.
10/397,211
Filed
2003-03-27
Granted
2004-03-09
Kind
B1