IP Library Granted Patent US 6,704,675
Granted Patent Utility
US 6,704,675 · App. 09/605,978

Method of detecting an integrated circuit in failure among integrated circuits, apparatus of doing the same, and recording medium storing program for doing the same

Inventor: Kazuhiro Sakaguchi
Patented Case View Patent ↗
Granted: Mar 9, 2004 Filed: Jun 29, 2000
Inventor
Kazuhiro Sakaguchi
Assignee (at issue)
NEC CORPORATION

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Quick Facts
Patent No.
US 6,704,675
App. No.
09/605,978
Filed
2000-06-29
Granted
2004-03-09
Kind
B1