Granted Patent
Utility
US 6,704,893 · App. 09/638,904
Method for testing integrated circuits with an automatic test equipment
Inventors:
Peter Bauwens, Anton Chichkov
Patented Case
View Patent ↗
Granted: Mar 9, 2004
Filed: Aug 15, 2000
Inventors
Peter Bauwens
Anton Chichkov
Assignee (at issue)
ALCATEL
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.