Granted Patent
Utility
US 6,714,017 · App. 09/727,952
Method and system for infrared detection of electrical short defects
Inventors:
Marius Enachescu, Sergey Belikov, Stephen F. Meier
Patented Case
View Patent ↗
Granted: Mar 30, 2004
Filed: Nov 30, 2000
Inventors
Marius Enachescu
Sergey Belikov
Stephen F. Meier
Assignees (at issue)
Candescent Technologies Corporation
Candescent Intellectual Property Services, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.