Granted Patent
Utility
US 6,714,021 · App. 09/759,126
Integrated time domain reflectometry (TDR) tester
Inventor:
Emrys J. Williams
Patented Case
View Patent ↗
Granted: Mar 30, 2004
Filed: Jan 11, 2001
Inventor
Emrys J. Williams
Assignee (at issue)
Sun Microsystems Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.