IP Library Granted Patent US 6,714,035
Granted Patent Utility
US 6,714,035 · App. 10/184,496

System and method for measuring fault coverage in an integrated circuit

Inventor: Jeffrey Paul Witte
Patented Case View Patent ↗
Granted: Mar 30, 2004 Filed: Jun 28, 2002
Inventor
Jeffrey Paul Witte
Assignee (at issue)
Hewlett-Packard Development Company, L.P.

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Quick Facts
Patent No.
US 6,714,035
App. No.
10/184,496
Filed
2002-06-28
Granted
2004-03-30
Kind
B2