Granted Patent
Utility
US 6,717,428 · App. 09/705,073
Method and apparatus for detecting defects in a circuit using spectral analysis of transient power supply voltage
Inventor:
Michael R. Spica
Patented Case
View Patent ↗
Granted: Apr 6, 2004
Filed: Nov 2, 2000
Inventor
Michael R. Spica
Assignee (at issue)
Intel Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.