Granted Patent
Utility
US 6,718,487 · App. 09/604,220
Method for high speed testing with low speed semiconductor test equipment
Inventor:
Michael Sommer
Patented Case
View Patent ↗
Granted: Apr 6, 2004
Filed: Jun 27, 2000
Inventor
Michael Sommer
Assignee (at issue)
Infineon Technologies North America Corp.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.