Granted Patent
Utility
US 6,724,487 · App. 10/163,519
Apparatus and method for measuring digital imager, package and wafer bow and deviation from flatness
Inventors:
Michael A. Marcus, Thomas Kaltenbach, Duane M. Courtney, Jiann-Rong Lee
Patented Case
View Patent ↗
Granted: Apr 20, 2004
Filed: Jun 6, 2002
Inventors
Michael A. Marcus
Thomas Kaltenbach
Duane M. Courtney
Jiann-Rong Lee
Assignee (at issue)
EASTMAN KODAK COMPANY
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.