Granted Patent
Utility
US 6,728,910 · App. 09/665,749
Memory testing for built-in self-repair system
Inventor:
Johnnie A. Huang
Patented Case
View Patent ↗
Granted: Apr 27, 2004
Filed: Sep 20, 2000
Inventor
Johnnie A. Huang
Assignee (at issue)
LSI Logic Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.