Granted Patent
Utility
US 6,732,062 · App. 10/429,823
Apparatus for analyzing a failure of a semiconductor device and method thereof
Inventor:
Ki Won Hong
Patented Case
View Patent ↗
Granted: May 4, 2004
Filed: May 6, 2003
Inventor
Ki Won Hong
Assignee (at issue)
Dongbu Electronics, Co. Ltd.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.