Granted Patent
Utility
US 6,734,620 · App. 10/017,656
Structure, fabrication, and corrective test of electron-emitting device having electrode configured to reduce cross-over capacitance and/or facilitate short-circuit repair
Inventors:
Steven J. Radigan, Matthew A. Bonn, Hidenori Kemmotsu, Theodore S. Fahlen
Patented Case
View Patent ↗
Granted: May 11, 2004
Filed: Dec 12, 2001
Inventors
Steven J. Radigan
Matthew A. Bonn
Hidenori Kemmotsu
Theodore S. Fahlen
Assignees (at issue)
Candescent Technologies Corporation
Candescent Intellectual Property Services, Inc.
SONY GROUP CORPORATION
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.