Granted Patent
Utility
US 6,737,879 · App. 10/176,571
Method and apparatus for wafer scale testing
Inventor:
Morgan T. Johnson
Patented Case
View Patent ↗
Granted: May 18, 2004
Filed: Jun 21, 2002
Inventor
Morgan T. Johnson
Assignee (at issue)
Morgan Labs, LLC
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.