Granted Patent
Utility
US 6,742,149 · App. 09/849,255
Apparatus for testing semiconductor integrated circuits
Inventor:
Tokuya Osawa
Patented Case
View Patent ↗
Granted: May 25, 2004
Filed: May 7, 2001
Inventor
Tokuya Osawa
Assignee (at issue)
Renesas Technology Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.