Granted Patent
Utility
US 6,750,671 · App. 09/915,984
Apparatus for testing semiconductor devices
Inventor:
Udo Hartmann
Patented Case
View Patent ↗
Granted: Jun 15, 2004
Filed: Jul 25, 2001
Inventor
Udo Hartmann
Assignee (at issue)
Infineon Technologies AG
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.