Granted Patent
Utility
US 6,759,864 · App. 10/176,321
System and method for testing integrated circuits by transient signal analysis
Inventor:
Chintan Patel
Patented Case
View Patent ↗
Granted: Jul 6, 2004
Filed: Jun 20, 2002
Inventor
Chintan Patel
Assignee (at issue)
Agilent Technologies, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.