Granted Patent
Utility
US 6,760,873 · App. 09/815,519
Built-in self test for speed and timing margin for a source synchronous IO interface
Inventors:
Hong Hao, Keven Hui, Qingwen Deng, Chung-Jen Yui
Patented Case
View Patent ↗
Granted: Jul 6, 2004
Filed: Mar 23, 2001
Inventors
Hong Hao
Keven Hui
Qingwen Deng
Chung-Jen Yui
Assignee (at issue)
LSI Logic Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.