IP Library › Granted Patent US 6,760,874
Granted Patent Utility
US 6,760,874 · App. 10/139,294

Test access circuit and method of accessing embedded test controllers in integrated circuit modules

Inventors: Jean-Francois Cote, Benoit Nadeau-Dostie
Patented Case View Patent ↗
Granted: Jul 6, 2004 Filed: May 7, 2002
Inventors
Jean-Francois Cote
Benoit Nadeau-Dostie
Assignee (at issue)
LogicVision, Inc.

This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.

Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 6,760,874
App. No.
10/139,294
Filed
2002-05-07
Granted
2004-07-06
Kind
B2