Granted Patent
Utility
US 6,765,205 · App. 10/601,531
Electron microscope including apparatus for X-ray analysis and method of analyzing specimens using same
Inventors:
Isao Ochiai, Toshiei Kurosaki, Toshiro Kubo, Naomasa Suzuki
Patented Case
View Patent ↗
Granted: Jul 20, 2004
Filed: Jun 24, 2003
Inventors
Isao Ochiai
Toshiei Kurosaki
Toshiro Kubo
Naomasa Suzuki
Assignee (at issue)
Hitachi High-Technologies Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.