Granted Patent
Utility
US 6,765,403 · App. 10/067,206
Test circuit and test method for protecting an IC against damage from activation of too many current drawing circuits at one time
Inventors:
Franciscus Gerardus Maria De Jong, Rodger Frank Schuttert, Johannes De Wilde, Gerrit Willem den Besten
Patented Case
View Patent ↗
Granted: Jul 20, 2004
Filed: Feb 5, 2002
Inventors
Franciscus Gerardus Maria De Jong
Rodger Frank Schuttert
Johannes De Wilde
Gerrit Willem den Besten
Assignee (at issue)
KONINKLIJKE PHILIPS ELECTRONICS NV
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.