Granted Patent
Utility
US 6,765,414 · App. 10/246,377
Low frequency testing, leakage control, and burn-in control for high-performance digital circuits
Inventors:
Ali Keshavarzi, Bhaskar P. Chatterjee, Ram Krishnamurthy, Manoj Sachdev
Patented Case
View Patent ↗
Granted: Jul 20, 2004
Filed: Sep 17, 2002
Inventors
Ali Keshavarzi
Bhaskar P. Chatterjee
Ram Krishnamurthy
Manoj Sachdev
Assignee (at issue)
Intel Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.