Granted Patent
Utility
US 6,766,483 · App. 09/915,756
Semiconductor test apparatus
Inventor:
Nobuaki Takeuchi
Patented Case
View Patent ↗
Granted: Jul 20, 2004
Filed: Jul 26, 2001
Inventor
Nobuaki Takeuchi
Assignee (at issue)
Ando Electric Co., Ltd.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.