Granted Patent
Utility
US 6,768,102 · App. 09/594,169
Method and system for recalibration during micro-imaging to determine thermal drift
Inventor:
David F. Skoll
Patented Case
View Patent ↗
Granted: Jul 27, 2004
Filed: Jun 15, 2000
Inventor
David F. Skoll
Assignee (at issue)
CHIPWORKS INCORPORATED
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.