Granted Patent
Utility
US 6,768,110 · App. 09/874,766
Ion beam milling system and method for electron microscopy specimen preparation
Inventor:
Reza Alani
Patented Case
View Patent ↗
Granted: Jul 27, 2004
Filed: Jun 5, 2001
Inventor
Reza Alani
Assignee (at issue)
GATAN, INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.