Granted Patent
Utility
US 6,768,133 · App. 10/124,453
Semiconductor device, test method for semiconductor device, and tester for semiconductor device
Inventor:
Yasumasa Nishimura
Patented Case
View Patent ↗
Granted: Jul 27, 2004
Filed: Apr 18, 2002
Inventor
Yasumasa Nishimura
Assignee (at issue)
Renesas Technology Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.