IP Library › Granted Patent US 6,768,952
Granted Patent Utility
US 6,768,952 · App. 10/274,787

System and method of measuring low impedances

Inventors: Isaac Kantorovich, Christopher Houghton, James J. St. Laurent
Patented Case View Patent ↗
Granted: Jul 27, 2004 Filed: Oct 21, 2002
Inventors
Isaac Kantorovich
Christopher Houghton
James J. St. Laurent
Assignee (at issue)
Hewlett-Packard Development Company, L.P.

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Quick Facts
Patent No.
US 6,768,952
App. No.
10/274,787
Filed
2002-10-21
Granted
2004-07-27
Kind
B2