Granted Patent
Utility
US 6,769,083 · App. 09/437,249
Test pattern generator, a testing device, and a method of generating a plurality of test patterns
Inventors:
Masaru Tsuto, Tatsuya Yamada
Patented Case
View Patent ↗
Granted: Jul 27, 2004
Filed: Nov 10, 1999
Inventors
Masaru Tsuto
Tatsuya Yamada
Assignee (at issue)
Advantest Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.