Granted Patent
Utility
US 6,770,867 · App. 10/186,206
Method and apparatus for scanned instrument calibration
Inventors:
Henri J. Lezec, Christian R. Musil
Patented Case
View Patent ↗
Granted: Aug 3, 2004
Filed: Jun 27, 2002
Inventors
Henri J. Lezec
Christian R. Musil
Assignee (at issue)
FEI Company
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.