Granted Patent
Utility
US 6,774,702 · App. 10/188,685
Fuse trimming failure test circuit for CMOS circuit
Inventor:
Ryohei Kimura
Patented Case
View Patent ↗
Granted: Aug 10, 2004
Filed: Jul 3, 2002
Inventor
Ryohei Kimura
Assignee (at issue)
SEIKO INSTRUMENTS INC.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.