Granted Patent
Utility
US 6,775,192 · App. 10/167,817
Memory device tester and method for testing reduced power states
Inventors:
Matthew R. Harrington, Van Huynh, Adin E. Hyslop
Patented Case
View Patent ↗
Granted: Aug 10, 2004
Filed: Jun 12, 2002
Inventors
Matthew R. Harrington
Van Huynh
Adin E. Hyslop
Assignee (at issue)
Micron Technology, Inc.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.