IP Library Granted Patent US 6,777,138
Granted Patent Utility
US 6,777,138 · App. 10/099,279

Mask product made by selection of evaluation point locations based on proximity effects model amplitudes for correcting proximity effects in a fabricat layout

Inventors: Christophe Pierrat, Youping Zhang
Patented Case View Patent ↗
Granted: Aug 17, 2004 Filed: Mar 15, 2002
Inventors
Christophe Pierrat
Youping Zhang
Assignee (at issue)
Numerical Technologies, Inc.

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Quick Facts
Patent No.
US 6,777,138
App. No.
10/099,279
Filed
2002-03-15
Granted
2004-08-17
Kind
B2