Granted Patent
Utility
US 6,777,252 · App. 10/441,330
Method and apparatus for testing an individual lightwave chip on a wafer
Inventor:
Jiten Sarathy
Patented Case
View Patent ↗
Granted: Aug 17, 2004
Filed: May 20, 2003
Inventor
Jiten Sarathy
Assignee (at issue)
Alphion Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.