Granted Patent
Utility
US 6,779,144 · App. 09/996,722
Semiconductor integrated circuit device and method of testing it
Inventors:
Hideki Hayashi, Keiichi Higeta, Shigeru Nakahara
Patented Case
View Patent ↗
Granted: Aug 17, 2004
Filed: Nov 30, 2001
Inventors
Hideki Hayashi
Keiichi Higeta
Shigeru Nakahara
Assignees (at issue)
Renesas Technology Corporation
Hitachi Ulsi Systems Co., Ltd.
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.