Granted Patent
Utility
US 6,782,502 · App. 10/262,271
Combinational test pattern generation method and apparatus
Inventor:
Wern-Yan Koe
Patented Case
View Patent ↗
Granted: Aug 24, 2004
Filed: Oct 1, 2002
Inventor
Wern-Yan Koe
Assignee (at issue)
NEC Electronics Corporation
This patent predates the USPTO's electronic file wrapper — prosecution documents from this era exist only in the Patent Office's paper records. A certified copy of the file history can be ordered from the USPTO's paper archives.